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Teardown Reverse Engineering

In order to reveal the true structure of an IC chip, our engineers employ Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and other similar techniques to show each individual layer in the chip. We partner with the leading testing laboratories across the country in order to leverage the best tools and the best expertise required for understanding and documenting the internal structure - while keeping costs of discovery low for the client.

We tear down electronics products such as smartphones, televisions, wearables, peripherals, etc. to reveal the internal circuity and IC packages that implement core functionalities of the products. Identifying each chip in the products helps our client conduct litigation discovery in the right direction as well as improve technical accuracy of their damages/royalty calculation.

Our engineers use state of the art RE techniques to decapsulate IC packages in order to reveal the technology and materials used in fabricating a given chip - as well as the general blueprint and major component blocks inside the chip. For many types of chips, we can perform active probe testing as well to show how these component blocks react to certain signals.

Reverse Engineering Tools and Equipment
Reverse Engineering Tools and Equipment

Want to know more about how we use reverse engineering to show evidence of patent infringement?

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How does a Scanning Electron Microscope (SEM) work?

How does a Transmission Electron Microscope (TEM) work?

Hardware Technician
Image by L N

What is EELS (Electron Energy Loss Spectroscopy)?

What is EDX (Energy Dispersive X-Ray Spectroscopy)?

Image by National Cancer Institute
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